DEMİR, İ. Et Al. 2016. Ellipsometry and Photoluminescence Characterization of MOCVD Grown AlxGa1 xAs Layers x 0 21 0 33 0 42. 16th International Balkan Workshop on Applied Physics and Materials Science (IBWAP 2016) , (Constanta, Romania).

DEMİR, İ., KIZILBULUt, A. A., BULUt, B., & ELAGÖZ, S., (2016). Ellipsometry and Photoluminescence Characterization of MOCVD Grown AlxGa1 xAs Layers x 0 21 0 33 0 42 . 16th International Balkan Workshop on Applied Physics and Materials Science (IBWAP 2016), Constanta, Romania

DEMİR, İLKAY Et Al. "Ellipsometry and Photoluminescence Characterization of MOCVD Grown AlxGa1 xAs Layers x 0 21 0 33 0 42," 16th International Balkan Workshop on Applied Physics and Materials Science (IBWAP 2016), Constanta, Romania, 2016

DEMİR, İLKAY Et Al. "Ellipsometry and Photoluminescence Characterization of MOCVD Grown AlxGa1 xAs Layers x 0 21 0 33 0 42." 16th International Balkan Workshop on Applied Physics and Materials Science (IBWAP 2016) , Constanta, Romania, 2016

DEMİR, İ. Et Al. (2016) . "Ellipsometry and Photoluminescence Characterization of MOCVD Grown AlxGa1 xAs Layers x 0 21 0 33 0 42." 16th International Balkan Workshop on Applied Physics and Materials Science (IBWAP 2016) , Constanta, Romania.

@conferencepaper{conferencepaper, author={İLKAY DEMİR Et Al. }, title={Ellipsometry and Photoluminescence Characterization of MOCVD Grown AlxGa1 xAs Layers x 0 21 0 33 0 42}, congress name={16th International Balkan Workshop on Applied Physics and Materials Science (IBWAP 2016)}, city={Constanta}, country={Romania}, year={2016}}