Heidrich, J. Et Al. 2021. Full optical SESAM characterization methods in the 1.9 to 3-µm wavelength regime. Optics Express , vol.29, no.5 , 6647-6656.

Heidrich, J., Gaulke, M., Alaydin, B. Ö., Golling, M., Barh, A., & Keller, U., (2021). Full optical SESAM characterization methods in the 1.9 to 3-µm wavelength regime. Optics Express , vol.29, no.5, 6647-6656.

Heidrich, Jonas Et Al. "Full optical SESAM characterization methods in the 1.9 to 3-µm wavelength regime," Optics Express , vol.29, no.5, 6647-6656, 2021

Heidrich, Jonas Et Al. "Full optical SESAM characterization methods in the 1.9 to 3-µm wavelength regime." Optics Express , vol.29, no.5, pp.6647-6656, 2021

Heidrich, J. Et Al. (2021) . "Full optical SESAM characterization methods in the 1.9 to 3-µm wavelength regime." Optics Express , vol.29, no.5, pp.6647-6656.

@article{article, author={Jonas Heidrich Et Al. }, title={Full optical SESAM characterization methods in the 1.9 to 3-µm wavelength regime}, journal={Optics Express}, year=2021, pages={6647-6656} }