DOĞAN, H. Et Al. 2017. ANNEALING TEMPERATURE DEPENDENT CHARACTERIZATION OF NI AU N GAN SCHOTTKY DIODE USING ARTIFICIAL BEE COLONY ALGORITHM. 5th International Conference on Advanced Technology Sciences .

DOĞAN, H., KOÇKANAT, S., TÜRKAY, Y., ŞEKER, M., ÇIKAN, M., & ÜNSAL ÇELİMLİ, D. B., (2017). ANNEALING TEMPERATURE DEPENDENT CHARACTERIZATION OF NI AU N GAN SCHOTTKY DIODE USING ARTIFICIAL BEE COLONY ALGORITHM . 5th International Conference on Advanced Technology Sciences

DOĞAN, HÜLYA Et Al. "ANNEALING TEMPERATURE DEPENDENT CHARACTERIZATION OF NI AU N GAN SCHOTTKY DIODE USING ARTIFICIAL BEE COLONY ALGORITHM," 5th International Conference on Advanced Technology Sciences, 2017

DOĞAN, HÜLYA Et Al. "ANNEALING TEMPERATURE DEPENDENT CHARACTERIZATION OF NI AU N GAN SCHOTTKY DIODE USING ARTIFICIAL BEE COLONY ALGORITHM." 5th International Conference on Advanced Technology Sciences , 2017

DOĞAN, H. Et Al. (2017) . "ANNEALING TEMPERATURE DEPENDENT CHARACTERIZATION OF NI AU N GAN SCHOTTKY DIODE USING ARTIFICIAL BEE COLONY ALGORITHM." 5th International Conference on Advanced Technology Sciences .

@conferencepaper{conferencepaper, author={HÜLYA DOĞAN Et Al. }, title={ANNEALING TEMPERATURE DEPENDENT CHARACTERIZATION OF NI AU N GAN SCHOTTKY DIODE USING ARTIFICIAL BEE COLONY ALGORITHM}, congress name={5th International Conference on Advanced Technology Sciences}, city={}, country={}, year={2017}}