Yildirim, N. Et Al. 2009. DEPENDENCE OF CHARACTERISTIC DIODE PARAMETERS IN Ni/n-GaAs CONTACTS ON THERMAL ANNEALING AND SAMPLE TEMPERATURE. INTERNATIONAL JOURNAL OF MODERN PHYSICS B , vol.23, no.27 , 5237-5249.

Yildirim, N., Dogan, H., Korkut, H., & Turut, A., (2009). DEPENDENCE OF CHARACTERISTIC DIODE PARAMETERS IN Ni/n-GaAs CONTACTS ON THERMAL ANNEALING AND SAMPLE TEMPERATURE. INTERNATIONAL JOURNAL OF MODERN PHYSICS B , vol.23, no.27, 5237-5249.

Yildirim, N. Et Al. "DEPENDENCE OF CHARACTERISTIC DIODE PARAMETERS IN Ni/n-GaAs CONTACTS ON THERMAL ANNEALING AND SAMPLE TEMPERATURE," INTERNATIONAL JOURNAL OF MODERN PHYSICS B , vol.23, no.27, 5237-5249, 2009

Yildirim, N. Et Al. "DEPENDENCE OF CHARACTERISTIC DIODE PARAMETERS IN Ni/n-GaAs CONTACTS ON THERMAL ANNEALING AND SAMPLE TEMPERATURE." INTERNATIONAL JOURNAL OF MODERN PHYSICS B , vol.23, no.27, pp.5237-5249, 2009

Yildirim, N. Et Al. (2009) . "DEPENDENCE OF CHARACTERISTIC DIODE PARAMETERS IN Ni/n-GaAs CONTACTS ON THERMAL ANNEALING AND SAMPLE TEMPERATURE." INTERNATIONAL JOURNAL OF MODERN PHYSICS B , vol.23, no.27, pp.5237-5249.

@article{article, author={N. Yildirim Et Al. }, title={DEPENDENCE OF CHARACTERISTIC DIODE PARAMETERS IN Ni/n-GaAs CONTACTS ON THERMAL ANNEALING AND SAMPLE TEMPERATURE}, journal={INTERNATIONAL JOURNAL OF MODERN PHYSICS B}, year=2009, pages={5237-5249} }