H. Korkut Et Al. , "Analysis of current-voltage-temperature characteristics and T0 anomaly in Cr/n-GaAs Schottky diodes fabricated by magnetron sputtering technique," Materials Science and Engineering B: Solid-State Materials for Advanced Technology , vol.157, pp.48-52, 2009
Korkut, H. Et Al. 2009. Analysis of current-voltage-temperature characteristics and T0 anomaly in Cr/n-GaAs Schottky diodes fabricated by magnetron sputtering technique. Materials Science and Engineering B: Solid-State Materials for Advanced Technology , vol.157 , 48-52.
Korkut, H., Yildirim, N., Turut, A., & Dogan, H., (2009). Analysis of current-voltage-temperature characteristics and T0 anomaly in Cr/n-GaAs Schottky diodes fabricated by magnetron sputtering technique. Materials Science and Engineering B: Solid-State Materials for Advanced Technology , vol.157, 48-52.
Korkut, H. Et Al. "Analysis of current-voltage-temperature characteristics and T0 anomaly in Cr/n-GaAs Schottky diodes fabricated by magnetron sputtering technique," Materials Science and Engineering B: Solid-State Materials for Advanced Technology , vol.157, 48-52, 2009
Korkut, H. Et Al. "Analysis of current-voltage-temperature characteristics and T0 anomaly in Cr/n-GaAs Schottky diodes fabricated by magnetron sputtering technique." Materials Science and Engineering B: Solid-State Materials for Advanced Technology , vol.157, pp.48-52, 2009
Korkut, H. Et Al. (2009) . "Analysis of current-voltage-temperature characteristics and T0 anomaly in Cr/n-GaAs Schottky diodes fabricated by magnetron sputtering technique." Materials Science and Engineering B: Solid-State Materials for Advanced Technology , vol.157, pp.48-52.
@article{article, author={H. Korkut Et Al. }, title={Analysis of current-voltage-temperature characteristics and T0 anomaly in Cr/n-GaAs Schottky diodes fabricated by magnetron sputtering technique}, journal={Materials Science and Engineering B: Solid-State Materials for Advanced Technology}, year=2009, pages={48-52} }