Hopoğlu, H. Et Al. 2022. Dependence of film thicknesses on the XRD, AFM and Transmittance Properties of NiOx. 3nd International Conference on Light and Light-based Technologies (ICLLT) , (Ankara, Turkey), 1-2.

Hopoğlu, H., Kaya, D., Akyol, M., Demir, İ., Altuntaş, İ., Ekicibil, A., ... Şenadım Tüzemen, E.(2022). Dependence of film thicknesses on the XRD, AFM and Transmittance Properties of NiOx . 3nd International Conference on Light and Light-based Technologies (ICLLT) (pp.1-2). Ankara, Turkey

Hopoğlu, Hicret Et Al. "Dependence of film thicknesses on the XRD, AFM and Transmittance Properties of NiOx," 3nd International Conference on Light and Light-based Technologies (ICLLT), Ankara, Turkey, 2022

Hopoğlu, Hicret Et Al. "Dependence of film thicknesses on the XRD, AFM and Transmittance Properties of NiOx." 3nd International Conference on Light and Light-based Technologies (ICLLT) , Ankara, Turkey, pp.1-2, 2022

Hopoğlu, H. Et Al. (2022) . "Dependence of film thicknesses on the XRD, AFM and Transmittance Properties of NiOx." 3nd International Conference on Light and Light-based Technologies (ICLLT) , Ankara, Turkey, pp.1-2.

@conferencepaper{conferencepaper, author={Hicret Hopoğlu Et Al. }, title={Dependence of film thicknesses on the XRD, AFM and Transmittance Properties of NiOx}, congress name={3nd International Conference on Light and Light-based Technologies (ICLLT)}, city={Ankara}, country={Turkey}, year={2022}, pages={1-2} }