Topographic characterization of unworn contact lenses assessed by atomic force microscopy and wavelet transform

Talu S., Stepien K., ÇAĞLAYAN M. O.

MICROSCOPY RESEARCH AND TECHNIQUE, cilt.78, sa.11, ss.1026-1031, 2015 (SCI-Expanded) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 78 Sayı: 11
  • Basım Tarihi: 2015
  • Doi Numarası: 10.1002/jemt.22580
  • Dergi Adı: MICROSCOPY RESEARCH AND TECHNIQUE
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.1026-1031
  • Sivas Cumhuriyet Üniversitesi Adresli: Evet

Özet

This paper analyses the three-dimensional (3-D) surface morphology of optic surface of unworn contact lenses (CLs) using atomic force microscopy (AFM) and wavelet transform. Refractive powers of all lens samples were 2.50 diopters. Topographic images were acquired in contact mode in air-conditioned medium (35% RH, 23 degrees C). Topographic measurements were taken over a 5 mu m x 5 mu m area with 512 pixel resolution. Resonance frequency of the tip was 65 kHz. The 3-D surface morphology of CL unworn samples revealed (3-D) micro-textured surfaces that can be analyzed using (AFM) and wavelet transform. AFM and wavelet transform are accurate and sensitive tools that may assist CL manufacturers in developing CLs with optimal surface characteristics. Microsc. Res. Tech. 78:1026-1031, 2015. (c) 2015 Wiley Periodicals, Inc.