Polycrystalline zinc nitridefilms are deposited on Corning 7059 glass substrates by pulsedfiltered cathodic vacuum arc deposition (PFCVAD). The crystallographic structure is studied by means of x-ray diffraction. These measurements show that all thefilms are crystallized in the cubic structure, in a preferred orientation along the (332) and (631) directionsWeak XRD signal shows small crystallites distributed in an amorphous tissue. A small improvement of crystallinity is observed with annealing. Optical parameters such as absorption, energy band gap, Urbach tail, extinction coefficients have been determined. The Urbach tail energy is decreased with annealing at 500 degrees C for one hour. Energy band gap values are found to be increased by annealing.