Growth and characterization of PALE Si-doped AlN on sapphire substrate by MOVPE

Purlu K. M., Kocak M. N., Yolcu G., Perkitel I., Altuntaş İ., Demir İ.

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, cilt.142, 2022 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 142
  • Basım Tarihi: 2022
  • Doi Numarası: 10.1016/j.mssp.2022.106464
  • Dergi Adı: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED)
  • Anahtar Kelimeler: AlN, MOVPE, Si doped, Pulsed atomic layer epitaxy, EPITAXY, ALGAN, GAN, REDUCTION, LAYERS, MICROSTRUCTURE, NITRIDATION, SURFACTANT, MORPHOLOGY, QUALITY
  • Sivas Cumhuriyet Üniversitesi Adresli: Evet

Özet

In this study, we report different SiH4 flow condition effects on crystal, surface, optical, and electrical characteristics of heteroepitaxial Metal-Organic Vapor Phase Epitaxy (MOVPE) grown AlN layers on sapphire substrates. Adjustment of growth kinetics is very important to control the doping. Therefore, pulsed atomic layer epitaxy (PALE) was used to control the growth kinetics and reduce parasitic reactions that inevitably caused adverse impact on the properties of the epitaxial AlN films. As a result of HRXRD (high resolution x-ray diffraction) analysis, the (002) omega FWHM decreased significantly with the PALE method, while the increase occurred due to the development of V defects for the (102) omega scan. Atomic force microscopy (AFM) analyzes showed that SiH4 led to a 3D-like growth mode. It was demonstrated that the increased SiH4 flow increased Si incorporation into the Si-doped AlN layer while increased the sheet resistance due to the self-compensating effect obtained from secondary ion mass spectroscopy (SIMS) and I-V measurement results.