ANNEALING TEMPERATURE DEPENDENT CHARACTERIZATION OF NI AU N GAN SCHOTTKY DIODE USING ARTIFICIAL BEE COLONY ALGORITHM

DOĞAN H., KOÇKANAT S., TÜRKAY Y., ŞEKER M., ÇIKAN M., ÜNSAL ÇELİMLİ D. B.

5th International Conference on Advanced Technology Sciences, 9 - 12 May 2017, (Summary Text)

• Publication Type: Conference Paper / Summary Text
• Sivas Cumhuriyet University Affiliated: Yes